HARWIN Spring Test Probe with Serrated Tip

The Harwin P13-4023 is a spring-loaded test probe designed for automated test equipment (ATE) and high-density PCB test applications. Featuring a serrated tip and a gold-plated beryllium copper contact, it supports a 1.27 mm pitch (0.05″) interface and is rated for up to 3 A, with typical contact resistance around 30 mω.

Salient Features and Benefits of Choosing the HARWIN Spring Test Probe with Serrated Tip

• Serrated tip ensures reliable contact with test pads, leads or circuitry.
• Gold-plated beryllium copper tip and phosphor bronze body resist wear and maintain signal integrity.
• Built for 1.27 mm (0.05″) centre-pitch environments, enabling dense test layouts.
• Modular two-part design (probe and sleeve receptacle) allows easy replacement without disturbing wiring.

Engineered for Precision Test Environments

The P13-4023 is crafted to offer uniform contact force and minimal signal distortion in high-throughput test fixtures. The gold plating on the tip enhances conductivity and corrosion resistance, ensuring long life and low maintenance. Its adoption in densely packed PCB test arrays helps reduce false readings and downtime.

Typical Uses of the Product

• ATE systems for in-circuit or functional testing of PCBs in the electronics manufacturing process.
• Test jigs and fixtures requiring high‐density probe arrays for leads, pads or SMT devices.
• Verification of connectors, sockets or switching arrays in telecom, automotive or industrial control equipment.
• Calibration rigs and lab equipment.

For more information please check the datasheets.